• DocumentCode
    840890
  • Title

    High K BaTiO/sub 3/ films from metalloorganic precursors

  • Author

    Xu, J.J. ; Shaikh, A.S. ; Vest, R.W.

  • Author_Institution
    Turner Lab., Purdue Univ., West Lafayette, IN, USA
  • Volume
    36
  • Issue
    3
  • fYear
    1989
  • fDate
    5/1/1989 12:00:00 AM
  • Firstpage
    307
  • Lastpage
    312
  • Abstract
    Crack-free and dense BaTiO/sub 3/ films 4 to 8 mu m thick were prepared by spinning a solution of metalloorganic precursors onto an appropriate substrate, and firing and annealing the film in air at certain temperatures to obtain appropriate grain sizes. The electrical properties of the films were studied as a function of grain size, temperature, frequency, and DC bias. Films with a grain size of 0.2 mu m showed ferroelectric properties similar to bulk BaTiO/sub 3/.<>
  • Keywords
    annealing; barium compounds; coating techniques; ferroelectric thin films; grain size; 4 to 8 micron; BaTiO/sub 3/ films; DC bias; annealing; ferroelectric properties; firing; frequency; grain sizes; metalloorganic precursors; temperature; Barium; Dielectric constant; Ferroelectric films; Ferroelectric materials; Grain size; High K dielectric materials; High-K gate dielectrics; Sputtering; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.19168
  • Filename
    19168