Title :
High critical current density in high field in Sm1+xBa2-xCu3O6+y thin films
Author :
Yoshida, Yutaka ; Ichino, Yusuke ; Miura, Masashi ; Takai, Yoshiaki ; Matsumoto, Kaname ; Ichinose, Ataru ; Horii, Shigeru ; Mukaida, Masashi
Author_Institution :
Dept. of Energy Eng. & Sci., Nagoya Univ., Japan
fDate :
6/1/2005 12:00:00 AM
Abstract :
Critical current density (Jc), irreversibility field (Birr) and microstructure in epitaxial SmBa2Cu3O7-x (SmBCO) films are reported. We have developed a novel approach to deposit high performance Sm1+xBa2-xCu3O6+y (Sm-123) at relatively low substrate temperature on MgO. The use of thin SmBCO seed layer grown at a high substrate temperature enabled us to obtain fully c-axis oriented SmBCO films with high critical current density (Jc) of 2.8×105 A/cm2 under 5 T for B//c at 77 K. This value is as high as in the optimized NbTi superconducting wires achieved for 5 T at 4.2 K. Compared with YBa2Cu3O7-y films, Sm-123 films showed higher Jc in high fields at 77 K. Transmission electron microscopy TEM analyses clarified the Sm/Ba composition ratio fluctuations in the Sm-123 matrix composition in the range of x=0∼0.14 with a wavelength of 50∼100 nm.
Keywords :
barium compounds; critical current density (superconductivity); epitaxial growth; magnesium compounds; magnetic fields; niobium alloys; samarium compounds; superconducting thin films; transmission electron microscopy; wires (electric); yttrium compounds; MgO; NbTi; NbTi superconducting wires; Sm-123 films; Sm-123 matrix composition; SmBaCu3O; YBa2Cu3O7; composition ratio fluctuations; high critical current density; high substrate temperature; irreversibility field; magnetic field measurement; microstructure; superconducting film; thin SmBCO seed layer; transmission electron microscopy analyses; Critical current density; Fluctuations; Microstructure; Niobium compounds; Substrates; Superconducting filaments and wires; Superconducting films; Temperature distribution; Titanium compounds; Transmission electron microscopy; Magnetic field measurement; superconducting film; superconducting wires; thin films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.847798