DocumentCode
840989
Title
Cold Cathode Fluorescent Lamps Driven by Piezoelectric Transformers: Stability Conditions and Thermal Effect
Author
Ben-yaakov, Sam ; Peretz, Mor Mordechai
Author_Institution
Dept. of Electr. & Comput. Eng., Ben-Gurion Univ., Beer Sheva
Volume
22
Issue
3
fYear
2007
fDate
5/1/2007 12:00:00 AM
Firstpage
761
Lastpage
768
Abstract
The envelope impedance (EI) concept was used to develop a systematic and simple approach for studying the conditions for stability of piezoelectric transformers (PT) based ballasts for cold cathode fluorescent lamps (CCFL) systems and the implications of the thermal operating conditions on such systems. The envelope analysis of the CCFL, which was verified experimentally, revealed that the magnitude of the negative EI decreases with temperature. This might cause the system to become unstable at low temperatures due to the fact that the loop gain of the PT-CCFL system encircled the (-1, 0) point in the Nyquist plane. In such cases, the PT-CCFL system may enter a quasi-stable oscillatory operation mode in which the current is AM modulated by a low frequency parasitic signal. This phenomenon is analyzed and explained by considering the temperature effect on the EI of the CCFL. The results of this work provide an insight into the stability issue of the PT-CCFL system, and could help in finding remedies to the instability
Keywords
amplitude modulation; electric impedance; fluorescent lamps; lamp accessories; oscillations; piezoelectric devices; transformers; AM; Nyquist plane; cold cathode fluorescent lamps; envelope impedance concept; piezoelectric transformers; quasistable oscillatory operation mode; stability conditions; thermal effect; Analytical models; Cathodes; Electronic ballasts; Fluorescent lamps; Frequency; Impedance; Power electronics; Temperature; Thermal stability; Transformers; Cold cathode fluorescent lamp (CCFL); envelope impedance (EI); piezoelectric transformer (PT);
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2007.896446
Filename
4182445
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