Title :
Coordinated characterization of coated conductors (C4)
Author :
Maroni, V.A. ; Venkataraman, K. ; Miller, D.J. ; Trasobares, S. ; Lei, Y. ; Hiller, J.M. ; Gray, K.E. ; Vlasko-Vlasov, V.K. ; Claus, H. ; Reeves, J. ; Rupich, M.W. ; Zhang, W. ; Kodenkandath, T. ; Li, X.
Author_Institution :
Argonne Nat. Lab., IL, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
Argonne National Laboratory, in collaboration with American Superconductor and SuperPower, Inc., has established/implemented a coordinated set of characterization methods for coated conductor specimens that can be applied in a manner compatible with further processing or utilization of the respective specimen. These characterization methods include measurements of superconductor transport properties, phase composition, microstructure, and epitaxy quality for YBCO coated conductors that range in size up to multi-meter-length tapes. Recent examinations involving the integrated application of magneto-optical imaging (MOI), Raman microspectroscopy, and focused-ion-beam-assisted transmission electron microscopy (TEM) to meter-length tapes have pinpointed specific microstructural and chemical defects that correlated with poor Ic performance.
Keywords :
barium compounds; critical currents; crystal microstructure; epitaxial growth; high-temperature superconductors; ion beam assisted deposition; superconducting tapes; transmission electron microscopy; yttrium compounds; Argonne National Laboratory; Raman microspectroscopy; YBCO coated conductors; YBaCuO; chemical defects; epitaxy quality; focused-ion-beam-assisted transmission electron microscopy; magneto-optical imaging; meter-length tapes; microstructural defects; microstructure; multi-meter-length tapes; phase composition; superconductor transport property; Collaboration; Conductors; Epitaxial growth; Laboratories; Microstructure; Phase measurement; Size measurement; Superconducting epitaxial layers; Superconducting films; Yttrium barium copper oxide; Coated conductor; Raman; YBCO; electron microscopy; magneto-optic;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.848216
