Title :
Distribution of inductive Jc in two-dimensional large-size YBCO films prepared by fluorine-free MOD on CeO2-buffered sapphire
Author :
Manabe, T. ; Sohma, M. ; Yamaguchi, I. ; Kondo, W. ; Tsukada, K. ; Kamiya, K. ; Mizuta, S. ; Kumagai, T.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Ibaraki, Japan
fDate :
6/1/2005 12:00:00 AM
Abstract :
Distribution of Jc in the two-dimensional large-size YBa2Cu3O7 (YBCO) film was investigated by an inductive method for the application to fault current limiter elements. The YBCO films were prepared by metal-organic deposition (MOD) using a fluorine-free acetylacetonate-based complex solution on R-plane sapphire with an evaporated-CeO2 buffer layer. The average Jc values of 1-3 MA/cm2 at 77 K were obtained for 1 cm × 12 cm-, 3 cm × 12 cm-, and 10 cm × 30 cm-rectangular YBCO films as well as on 2-inch-diameter films. In contrast with the TFA-MOD method via BaF2 precursor, the fluctuation of Jc in the present films was fairly small; no significant size effects or shape effects were recognized on the fluctuation of Jc. Instead, fluctuation of Jc depended on the average Jc values; higher-Jc films tended to exhibit more uniform Jc distribution.
Keywords :
barium compounds; cerium compounds; critical current density (superconductivity); fault current limiters; sapphire; superconducting thin films; yttrium compounds; 2D large-size YBCO films; 77 K; BaF2; CeO2; CeO2-buffered sapphire; R-plane sapphire; TFA-MOD method; YBa2Cu3O7; current density; evaporated-CeO2 buffer layer; fault current limiter elements; fluorine-free MOD; fluorine-free acetylacetonate-based complex solution; inductive Jc distribution; inductive method; metal organic deposition; metal-organic deposition; superconducting film; Buffer layers; Fluctuations; Furnaces; Pulsed laser deposition; Substrates; Superconducting films; Thermal conductivity; Thermal resistance; Thermal stresses; Yttrium barium copper oxide; Current density; metal organic deposition; sapphire; superconducting film;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.848635