DocumentCode :
841479
Title :
Frequency Diagnostic Universal Fault Protection for Current Fed Parallel Resonant Electronic Ballast
Author :
Yu, Qinghong ; Parisella, Joe
Author_Institution :
Res. & Dev. Labs, Osram Sylvania, Inc, Beverly, MA
Volume :
22
Issue :
3
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
881
Lastpage :
888
Abstract :
Current fed parallel resonant electronic ballast (PREB) dominates the applications for the T8 fluorescent lamp in North America for its advantage of low cost, flexibility and high reliability. At fault condition, a PREB generates much heat externally, and it is difficult to provide fault protection with traditional approaches. In this paper, a digital solution is presented to detect universal fault condition in PREB without sacrificing its other advantages. Operational principal of PREB is explored to show that the load impedance disturbance in PREB leads to frequency perturbation of the inverter, which can be detected with a very simple and low cost digital device for fault detection. Experiments show that this frequency diagnostic provides very sensitive and reliable fault detection for PREB. With both end-of-life lamp and anti-arcing protections implemented with one algorithm, this technology provides a superior fault protection to one of the most widely used ballast topologies and extends the potential applications of PREB in modern lighting industry
Keywords :
arcs (electric); fault diagnosis; fluorescent lamps; lamp accessories; resonant invertors; North America; T8 fluorescent lamp; antiarcing protections; current fed parallel resonant electronic ballast; end-of-life lamp; fault detection; frequency diagnostic universal fault protection; frequency perturbation; inverter; load impedance disturbance; Costs; Electronic ballasts; Fault detection; Fluorescent lamps; Frequency; Impedance; Inverters; North America; Protection; Resonance; Electronic ballast; fault protection; self-oscillation inverter;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2007.896517
Filename :
4182490
Link To Document :
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