DocumentCode
841659
Title
X-ray diffraction anomalies and random intercalation in H-loaded Y-Ba-Cu-O films
Author
Ariosa, Daniel ; Tsaneva, Vassilka N. ; Barber, Zoe H.
Author_Institution
Inst. of Phys. of Complex Matter, Lausanne, Switzerland
Volume
15
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
2993
Lastpage
2996
Abstract
A model has been developed to account for the structural peculiarities observed by X-ray diffraction of hydrogen-loaded Y123 films deposited in an O2/Ar+H2O atmosphere. The model considers the random inter-growth of two very similar structures with slightly different c-axis or, equivalently, the random intercalation of a small spacer in the Y123 matrix causing displacement disorder along the c-axis direction. It quantitatively reproduces both the nonmonotonous deviations of Bragg-peaks and their progressive weakening and broadening for higher diffraction orders. The model offers the possibility to evaluate both the fraction of secondary phase and its c-axis lattice parameter. In the example given, we have been able to identify 28% of intercalated hydrogen bronze H0.66[Y123] with 4% elongated c-axis. A simplified procedure for the diagnosis and characterization of random intercalates is extracted from the model. Similar structures observed in other perovskite-based layered oxides are discussed within this framework.
Keywords
Bragg gratings; X-ray diffraction; barium compounds; high-temperature superconductors; intercalation compounds; superconducting thin films; yttrium compounds; Bragg-peaks; X-ray diffraction anomalies; X-ray measurement; Y123 matrix; YBa2Cu3O7; high-temperature superconductors; hydrogen-loaded Y123 films; perovskite-based layered oxides; random intercalation; thin films; Atmosphere; Atmospheric modeling; Hydrogen; Lattices; Optical films; Optical reflection; Sputtering; X-ray diffraction; X-ray scattering; Yttrium barium copper oxide; Disorder; high-temperature superconductors; thin films; x-ray measurements;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2005.848698
Filename
1440298
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