• DocumentCode
    841659
  • Title

    X-ray diffraction anomalies and random intercalation in H-loaded Y-Ba-Cu-O films

  • Author

    Ariosa, Daniel ; Tsaneva, Vassilka N. ; Barber, Zoe H.

  • Author_Institution
    Inst. of Phys. of Complex Matter, Lausanne, Switzerland
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    2993
  • Lastpage
    2996
  • Abstract
    A model has been developed to account for the structural peculiarities observed by X-ray diffraction of hydrogen-loaded Y123 films deposited in an O2/Ar+H2O atmosphere. The model considers the random inter-growth of two very similar structures with slightly different c-axis or, equivalently, the random intercalation of a small spacer in the Y123 matrix causing displacement disorder along the c-axis direction. It quantitatively reproduces both the nonmonotonous deviations of Bragg-peaks and their progressive weakening and broadening for higher diffraction orders. The model offers the possibility to evaluate both the fraction of secondary phase and its c-axis lattice parameter. In the example given, we have been able to identify 28% of intercalated hydrogen bronze H0.66[Y123] with 4% elongated c-axis. A simplified procedure for the diagnosis and characterization of random intercalates is extracted from the model. Similar structures observed in other perovskite-based layered oxides are discussed within this framework.
  • Keywords
    Bragg gratings; X-ray diffraction; barium compounds; high-temperature superconductors; intercalation compounds; superconducting thin films; yttrium compounds; Bragg-peaks; X-ray diffraction anomalies; X-ray measurement; Y123 matrix; YBa2Cu3O7; high-temperature superconductors; hydrogen-loaded Y123 films; perovskite-based layered oxides; random intercalation; thin films; Atmosphere; Atmospheric modeling; Hydrogen; Lattices; Optical films; Optical reflection; Sputtering; X-ray diffraction; X-ray scattering; Yttrium barium copper oxide; Disorder; high-temperature superconductors; thin films; x-ray measurements;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.848698
  • Filename
    1440298