Title :
High quality SmBa2Cu3O7-δ thin films on SrTiO3 (100) substrates deposited by pulsed electron beam deposition
Author :
Ko, Kyoung Pil ; Moon, Seung Hyun ; Song, Kyu Jeong ; Park, Chan ; Yoo, Sang Im
Author_Institution :
Sch. of Mater. Sci. & Eng., Seoul Nat. Univ., South Korea
fDate :
6/1/2005 12:00:00 AM
Abstract :
We for the first time report a successful fabrication of a high-JC SmBa2Cu3O7-δ(SmBCO) thin film (∼240 nm thickness) on SrTiO3 (100) substrate by the pulsed electron beam deposition (PED) process. For this study, we systematically investigated the effect of processing parameters, including substrate temperature (Ts), ambient oxygen pressure (PO2), and target-to-substrate distance, on superconducting properties, including critical temperature (TC) and critical current density (JC), of PED-processed SmBCO films. The highest JC value of 1.37 MA/cm2 at 77 K in self field was obtained from an optimally processed sample using Ts of 900°C (corresponding to real substrate temperature of 810°C), PO2 of 15 mTorr, and target-to-substrate distance of 9 cm, evidencing that this process is a potential alternative to the PLD process.
Keywords :
critical current density (superconductivity); electron beam deposition; pulsed laser deposition; samarium compounds; strontium compounds; superconducting thin films; superconducting transition temperature; 15 mTorr; 240 nm; 77 K; 810 C; 9 cm; 900 C; PED; PO2; SmBCO thin film; SmBa2Cu3O7; SrTiO3; ambient oxygen pressure; critical current density; critical temperature; pulsed electron beam deposition; self field; substrate temperature; superconducting properties; target-to-substrate distance; Electron beams; Materials science and technology; Moon; Space vector pulse width modulation; Sputtering; Substrates; Superconducting materials; Superconducting thin films; Temperature; Yttrium barium copper oxide; Critical current density; SmBCO film; critical temperature; pulsed-electron-beam deposition (PED);
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.848735