Transport characterization of silicon-YBCO buffered multilayers deposited by magnetron sputtering

Author

Chiodoni, Angelica ; Camerlingo, Carlo ; Gerbaldo, Roberto ; Gozzelino, Laura ; Laviano, Francesco ; Minetti, Bruno ; Pirri, Candido F. ; Rombolà, Giuseppe ; Tallarida, Grazia ; Tresso, Elena ; Mezzetti, Enrica

Author_Institution

Dipt. di Fisica, Politecnico di Torino, Italy

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

3062

Lastpage

3065

Abstract

The paper reports on results concerning the Si/YSZ/CeO₂/YBCO multilayer prepared by means of magnetron sputtering. Such multilayer is considered for the possibility to compound the integration of YBCO films with silicon-based devices, with the unique, in perspective, properties of YBCO concerning photon sensors. We characterized YBCO films in such multilayer configuration by means of structural and dc transport measurements. It turns out that some granularity affects the transport properties of the YBCO film and lowers the critical currents. However, the lower temperature E-J characteristics are sharp enough to consider exploiting the transition between under critical and over critical (flux flow) state for future silicon-integrated broad-band photon sensors.

Keywords

barium compounds; buffer layers; caesium compounds; critical current density (superconductivity); high-temperature superconductors; silicon; silicon compounds; sputter deposition; superconducting epitaxial layers; yttrium compounds; zirconium compounds; Si-ZrO₂Y₂O₃-CeO₂-YBa₂Cu₃O₇; YBCO buffered multilayers; YBCO films; critical current; dc transport measurement; flux flow; granularity affects; magnetron sputtering; resistance measurement; silicon-based devices; silicon-integrated broad-band photon sensor; structural transport measurement; superconducting film; superconductor-semiconductor devices; transport characterization; transport properties; Critical current; Magnetic flux; Magnetic multilayers; Magnetic sensors; Optoelectronic and photonic sensors; Semiconductor films; Sensor phenomena and characterization; Sputtering; Temperature sensors; Yttrium barium copper oxide; Magnetron sputtering; resistance measurement; superconducting film; superconductor-semiconductor devices;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.848739

Filename

1440316