• DocumentCode
    841873
  • Title

    Evolution of a finite pulse of radiation in a high-power free-electron laser

  • Author

    Ting, A. ; Hafizi, B. ; Sprangle, P. ; Tang, C.M.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • Volume
    27
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    2529
  • Lastpage
    2538
  • Abstract
    The development of an optical pulse of finite axial extent is studied by means of an axisymmetric time-dependent particle simulation code for different rates of tapering of the wiggler field. The results illustrate a number of physical phenomena underlying the free-electron laser mechanism. These include: suppression of the sideband instability: the role of gain focusing versus that of refractive guiding: efficiency enhancement; and pulse slippage. It is found that a significant reduction in the sideband modulation of the optical field can be achieved with a faster tapering of the wiggler parameters. Increasing the tapering rate also reduces refractive guiding, causing the optical wavefronts to become more convex, thus spreading the optical field into a larger cross section. The corresponding enhancement of the peak output power is associated with an increased lateral extent of the optical field rather than an increase in the field amplitude
  • Keywords
    free electron lasers; laser theory; undulator radiation; axisymmetric time-dependent particle simulation code; efficiency enhancement; finite axial extent; finite radiation pulse evolution; gain focusing; high-power free-electron laser; laser mechanism; optical field; optical pulse; optical wavefronts; peak output power; pulse slippage; refractive guiding; sideband instability; sideband modulation; wiggler field tapering rates; Free electron lasers; Laboratories; Laser theory; Optical modulation; Optical pulses; Optical refraction; Particle beams; Physics; Plasmas; Undulators;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.104129
  • Filename
    104129