Title :
Noninterfering optical method of HBT circuit evaluation
Author :
Wang, K.C. ; Asbeck, P.M. ; Chang, M.F. ; Sullivan, G.J. ; Miller, Douglas L. ; Basit, H.F.
Author_Institution :
Rockwell Int. Sci. Center, Thousand Oaks, CA, USA
Abstract :
The authors report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infrared radiation emitted is ´visible´ to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.
Keywords :
bipolar integrated circuits; heterojunction bipolar transistors; infrared imaging; integrated circuit testing; integrated logic circuits; logic testing; television applications; AlGaAs-GaAs; CCTV camera; HBT circuit evaluation; IR radiation emission; TV monitor; base region; closed-circuit TV; collector current; heterojunction bipolar transistors; infrared radiation; integrated circuits; logic gate states determination; monolithic IC; radiative recombination;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890745
