• DocumentCode
    842005
  • Title

    Thermomechanical assessment of molding compounds

  • Author

    Selig, O. ; Alpern, P. ; Müller, K. ; Tilgner, R.

  • Author_Institution
    Siemens AG, Munchen, Germany
  • Volume
    15
  • Issue
    4
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    519
  • Lastpage
    523
  • Abstract
    A bending beam technique was used to classify different molding compounds by the shear stress exerted on the Si substrate. Production test chips encapsulated with these plastic materials were stressed by means of temperature cycling. The amount of mechanical degradation of the chips as determined after decapsulation turned out to be clearly correlated with the shear stress exerted by the plastic. Thus the bending beam technique allows the assessment of the components´ quality with respect to thermal cycling stress
  • Keywords
    encapsulation; materials testing; monolithic integrated circuits; packaging; polymers; silicon; thermal stresses; Si substrate; TCE; bending beam technique; coated Si beam test; mechanical degradation; molding compounds; shear stress exerted on Si; temperature cycling; thermal cycling stress; thermal expansion; thermomechanical assessment; Manufacturing; Metallization; Plastics; Silicon; Surface cracks; Temperature; Testing; Thermal expansion; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.159882
  • Filename
    159882