Generalized electron beam matching in the free-electron laser

Author

Elliott, C. James

Author_Institution

Los Alamos Nat. Lab., NM, USA

Volume

27

Issue

12

fYear

1991

fDate

12/1/1991 12:00:00 AM

Firstpage

2667

Lastpage

2672

Abstract

Three matching schemes are presented for Gaussian profile electron beams in free-electron lasers (FELs). The three different classes of matching or symmetry conditions are (1) electron beams with separate betatron matching in each plane, (2) those with aspect ratio matching, and (3) cross-matched beams. The new schemes are distinct generalizations of well-known betatron matching and include ribbon profiles. The corresponding effective energy distributions and their Fourier transforms are obtained in analytical form. An analytical kernel produces the key Fredholm integral equation that solves the initial value problem

Keywords

Fourier transforms; betatrons; electron beams; free electron lasers; initial value problems; integral equations; laser theory; FEL; Fourier transforms; Fredholm integral equation; Gaussian profile electron beams; analytical form; aspect ratio matching; cross-matched beams; effective energy distributions; free-electron laser; generalised electron beam matching; initial value problem; ribbon profiles; separate betatron matching; symmetry conditions; Algorithm design and analysis; Electron beams; Fourier transforms; Free electron lasers; Gaussian processes; Integral equations; Kernel; Laser modes; Laser theory; Optical modulation;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.104147

Filename

104147