• DocumentCode
    842151
  • Title

    Interface Threat Analysis and Current Injection Testing for Direct Drive SGEMP in Multiwire Cables

  • Author

    Tasca, Dante M. ; Beers, Brian L. ; Klisch, Joseph S. ; Tigner, John E.

  • Author_Institution
    General Electric Company, Space Division, Philadelphia, Pennsylvania 19101
  • Volume
    26
  • Issue
    6
  • fYear
    1979
  • Firstpage
    4918
  • Lastpage
    4926
  • Abstract
    In this paper we present: (1) the results of an extensive analytical and computational evaluation of the response of termination loads to cable SGEMP signals driven in multiwire cable bundles, and (2) the design, development and experimental verification results of a Multipin Current Injection Test (C.I.T.) Method for performing SGEMP hardness verification tests on electronic component boxes. These tests are imposed by satellite system survivability specifications which require that an SGEMP C.I.T. be performed on each Qualification Level Component Box to demonstrate SGEMP hardness verification. This C.I.T. method was developed to meet the technology needs for a user-oriented current injection technique using realistic hardware to correctly perform these SGEMP electrical simulation tests at the individual component box level as well as at the subsystem and system levels. The purpose of the analytical development work was to quantify the dependence of the termination response on the manifold of parameters which specify the cable SGEMP threat in multiwire cables. This quantification is essential for making a rational choice of the drive levels, coupling factors, and cable characteristic impedances to be chosen in the implementation of this test technique in order to perform a meaningful SGEMP C.I.T. at realistic maximum threat conditions.
  • Keywords
    Cables; Electronic components; Electronic equipment testing; Performance analysis; Performance evaluation; Qualifications; Satellites; Signal analysis; Signal design; System testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1979.4330250
  • Filename
    4330250