DocumentCode :
842160
Title :
An 8-Gb/s simultaneous bidirectional link with on-die waveform capture
Author :
Casper, Bryan ; Martin, Aaron ; Jaussi, James E. ; Kennedy, Joe ; Mooney, Randy
Author_Institution :
Intel Labs., Hillsboro, OR, USA
Volume :
38
Issue :
12
fYear :
2003
Firstpage :
2111
Lastpage :
2120
Abstract :
A full-duplex transceiver capable of 8-Gb/s data rates is implemented in 0.18-μm CMOS. This equalized transceiver has been optimized for small area (329 μm × 395 μm) and low power (158 mW) for point-to-point parallel links. Source-synchronous clocking and per-pin skew compensation eliminate coding bandwidth overhead and reduce latency, jitter, and complexity. This link is self-configuring through the use of automatic comparator offset trim and adaptive deskew. Comprehensive diagnostic capabilities have been integrated into the transceiver to provide link, interconnect, and circuit characterization without the use of external test equipment. With a resolution of 4 mV and 9 ps, these capabilities enable on-die eye diagram generation, equivalent time waveform capture, noise characterization, and jitter distribution measurements.
Keywords :
CMOS integrated circuits; communication complexity; jitter; transceivers; 0.18 μm CMOS; 0.18 micron; 158 mW; 329 micron; 395 micron; 4 mV 9 ps resolution; 8 Gbit/s; 8-Gb/s simultaneous bidirectional link; adaptive deskew; automatic comparator offset trim; circuit characterization; coding bandwidth overhead elimination; complexity reduction; comprehensive diagnostic capabilities; equalized transceiver; full-duplex transceiver; high-speed I/O; interconnect; jitter distribution measurements; jitter reduction; latency reduction; noise characterization; on-die eye diagram generation; on-die oscilloscope; on-die waveform capture; per-pin skew compensation; point-to-point parallel links; preemphasis; self-configuration; self-testing; source-synchronous clocking; time waveform capture; Bandwidth; Character generation; Clocks; Delay; Integrated circuit interconnections; Jitter; Noise generators; Signal analysis; Test equipment; Transceivers;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.818569
Filename :
1253858
Link To Document :
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