• DocumentCode
    842307
  • Title

    High-reflectivity AlAs0.52Sb0.48/GaInAs(P) distributed Bragg mirror on InP substrate for 1.3-1.55 mu m wavelengths

  • Author

    Tai, K. ; Cho, Andrew Y. ; Huang, K.F.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    25
  • Issue
    17
  • fYear
    1989
  • Firstpage
    1159
  • Lastpage
    1160
  • Abstract
    Periodic AlAs0.52Sb0.48/Ga0.47In0.53As quarter-wave distributed Bragg reflectors on InP substrates were prepared and with only eight pairs a peak reflectivity of 90% and a bandwidth of >or=0.2 mu m were measured. By the addition of P to the GaInAs alloy, this mirror structure would be useful for InP-based surface emitting laser application at 1.3-1.55 mu m wavelengths and would be superior to the previously studied GaInAsP/InP structure, where approximately 20 pairs are required to achieve similar reflection.
  • Keywords
    III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; gallium compounds; indium compounds; integrated optics; laser cavity resonators; mirrors; reflectivity; semiconductor junction lasers; 1.3 to 1.55 micron; AlAs 0.52Sb 0.48-Ga 0.47In 0.5 3AsP; AlAs 0.52Sb 0.48-GaInAs-InP; InP substrates; InP-based surface emitting laser application; cavity resonators; distributed Bragg mirror; high-reflectivity mirror; integrated optics; quarter-wave distributed Bragg reflectors; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890778
  • Filename
    41929