High-Quality Transition Fault ATPG for Small Delay Defects

Author

Vaseekar Kumar, Mahilchi Milir ; Tragoudas, Spyros

Volume

26

Issue

5

fYear

2007

fDate

5/1/2007 12:00:00 AM

Firstpage

983

Lastpage

989

Abstract

A new framework is proposed to generate compact quality tests to detect small delay defects by activating and propagating transition faults only along implicitly kept sensitizable critical paths. It is shown how to implicitly generate functions to derive tests for the proposed framework. The novelty of the method relies on a multivalued algebra that is used to generate the test functions with a single circuit traversal, independent of the number of critical paths. Experimental results demonstrate the effectiveness of the method

Keywords

Boolean algebra; automatic test pattern generation; delays; logic testing; multivalued logic; algebraic test generation; automatic test pattern generation; compact quality tests; delay faults; high-quality transition fault ATPG; multivalued algebra; small delay defects; Algebra; Automatic test pattern generation; Circuit faults; Circuit testing; Delay effects; Electrical fault detection; Fault detection; Manufacturing; Propagation delay; Test pattern generators; Automatic test pattern generation (ATPG); Boolean/algebraic test generation; delay faults; testing;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2006.884863

Filename

4193574