Title :
Picosecond electrical sampling using a scanning force microscope
Author :
Hou, A.S. ; Ho, F. ; Bloom, D.M.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
A scanning force microscope probe for measuring ultrafast voltage signals is demonstrated. The new technique is based on mixing due to the square-law force interaction present between the microscope tip and sample. Correlation of 100 ps pulses and mixing up to 20 GHz have been achieved.
Keywords :
atomic force microscopy; microwave measurement; probes; scanning electron microscopy; voltage measurement; 1 to 20 GHz; 100 ps; SFM probe; mixing; picosecond electrical sampling; scanning force microscope; square-law force interaction; ultrafast voltage signals;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19921481
