DocumentCode :
842943
Title :
The Effect of Design and Process Parameters on Electromechanical Coupling for a Thin-Film PZT Membrane
Author :
Al-Hattamleh, Omar ; Cho, Jeong ; Richards, Robert F. ; Bahr, David F. ; Richards, Cecilia D.
Author_Institution :
Sch. of Mech. & Mater. Eng., Washington State Univ., Pullman, WA
Volume :
15
Issue :
6
fYear :
2006
Firstpage :
1715
Lastpage :
1725
Abstract :
In this paper, a finite-element model is used to analyze the performance of a thin-film piezoelectric laminate for power generation applications. The focus is on the effects of residual stress, the ratio of PZT to substrate thickness, the substrate material, electrode coverage, boundary conditions, and side length on the electromechanical coupling coefficient. The results show that the residual stress has the most substantial effect on the electromechanical coupling coefficient and should be minimized to increase the electromechanical coupling. Attention to other design parameters can be used to further optimize electromechanical coupling. Electrode coverage should be kept close to 50%. For Si substrates, a Si/PZT ratio of 4 maximizes the electromechanical coupling coefficient. Substrates with higher stiffness lead to superior electromechanical coupling. The results show that design changes, which lead to increased electromechanical coupling, also lead to greater efficiency
Keywords :
direct energy conversion; electric power generation; finite element analysis; internal stresses; piezoelectric materials; piezoelectric thin films; MEMS power generation; electromechanical coupling coefficient; finite-element model; piezoelectric energy conversion; residual stress; thin-film PZT membrane; thin-film piezoelectric laminate; Biomembranes; Electrodes; Finite element methods; Laminates; Performance analysis; Piezoelectric films; Process design; Residual stresses; Substrates; Transistors; Electromechanical coupling; MEMS power generation; PZT; piezoelectric energy conversion;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2006.883575
Filename :
4020253
Link To Document :
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