• DocumentCode
    843051
  • Title

    On the Trend of Remaining Software Defect Estimation

  • Author

    Bai, Cheng-Gang ; Cai, Kai-Yuan ; Hu, Qing-Pei ; Ng, Szu-Hui

  • Author_Institution
    Dept. of Autom. Control, Beihang Univ., Beijing
  • Volume
    38
  • Issue
    5
  • fYear
    2008
  • Firstpage
    1129
  • Lastpage
    1142
  • Abstract
    Software defects play a key role in software reliability, and the number of remaining defects is one of most important software reliability indexes. Observing the trend of the number of remaining defects during the testing process can provide very useful information on the software reliability. However, the number of remaining defects is not known and has to be estimated. Therefore, it is important to study the trend of the remaining software defect estimation (RSDE). In this paper, the concept of RSDE curves is proposed. An RSDE curve describes the dynamic behavior of RSDE as software testing proceeds. Generally, RSDE changes over time and displays two typical patterns: 1) single mode and 2) multiple modes. This behavior is due to the different characteristics of the testing process, i.e., testing under a single testing profile or multiple testing profiles with various change points. By studying the trend of the estimated number of remaining software defects, RSDE curves can provide further insights into the software testing process. In particular, in this paper, the Goel-Okumoto model is used to estimate this number on actual software failure data, and some properties of RSDE are derived. In addition, we discuss some theoretical and application issues of the RSDE curves. The concept of the proposed RSDE curves is independent of the selected model. The methods and development discussed in this paper can be applied to any valid estimation model to develop and study its corresponding RSDE curve. Finally, we discuss several possible areas for future research.
  • Keywords
    program debugging; program testing; software metrics; software reliability; stochastic processes; Goel-Okumoto nonhomogeneous Poisson process model; RSDE curve; dynamic behavior; remaining software defect estimation; software failure data; software reliability index; software testing; Application software; Displays; Laboratories; Maximum likelihood detection; Maximum likelihood estimation; Probability distribution; Software reliability; Software testing; Space technology; Zinc; Remaining software defect estimation (RSDE) curve; software defects; software reliability; software testing profile;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/TSMCA.2008.2001071
  • Filename
    4604821