• DocumentCode
    84320
  • Title

    A Multicycle Test Set Based on a Two-Cycle Test Set With Constant Primary Input Vectors

  • Author

    Pomeranz, Irith

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    34
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    1124
  • Lastpage
    1132
  • Abstract
    Test compaction can be achieved by using multicycle tests. To avoid the computationally intensive process of sequential test generation, multicycle tests can be generated by extending two-cycle tests. However, the scan-in state of a two-cycle test is not always effective for a multicycle test when the primary input vectors are held constant during the functional clock cycles of a test. This paper studies the extent of this issue by considering exhaustive two-cycle and multicycle test sets with constant primary input vectors for finite-state machine benchmarks. Based on the results of this study, it describes an efficient test compaction procedure that modifies selected two-cycle tests in a given test set in order to make them more effective as a source for multicycle tests with constant primary input vectors. Experimental results are presented to demonstrate the importance of this step to test compaction.
  • Keywords
    circuit testing; finite state machines; constant primary input vector; finite-state machine; functional clock cycle; multicycle test set; sequential test generation; test compaction procedure; two-cycle test set; Benchmark testing; Circuit faults; Clocks; Compaction; Delays; Niobium; Vectors; Broadside tests; multi-cycle tests; multicycle tests; test compaction; test generation; transition faults;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2015.2408257
  • Filename
    7052337