DocumentCode
84320
Title
A Multicycle Test Set Based on a Two-Cycle Test Set With Constant Primary Input Vectors
Author
Pomeranz, Irith
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
34
Issue
7
fYear
2015
fDate
Jul-15
Firstpage
1124
Lastpage
1132
Abstract
Test compaction can be achieved by using multicycle tests. To avoid the computationally intensive process of sequential test generation, multicycle tests can be generated by extending two-cycle tests. However, the scan-in state of a two-cycle test is not always effective for a multicycle test when the primary input vectors are held constant during the functional clock cycles of a test. This paper studies the extent of this issue by considering exhaustive two-cycle and multicycle test sets with constant primary input vectors for finite-state machine benchmarks. Based on the results of this study, it describes an efficient test compaction procedure that modifies selected two-cycle tests in a given test set in order to make them more effective as a source for multicycle tests with constant primary input vectors. Experimental results are presented to demonstrate the importance of this step to test compaction.
Keywords
circuit testing; finite state machines; constant primary input vector; finite-state machine; functional clock cycle; multicycle test set; sequential test generation; test compaction procedure; two-cycle test set; Benchmark testing; Circuit faults; Clocks; Compaction; Delays; Niobium; Vectors; Broadside tests; multi-cycle tests; multicycle tests; test compaction; test generation; transition faults;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2015.2408257
Filename
7052337
Link To Document