Title :
Semianalytical method for calculating the impedance variation of an arbitrary eddy-current probe
Author :
Juillard, Jerome ; Pichenot, Gregoire ; Masia, Antoine
Author_Institution :
Dept. of Meas., SUPELEC, Gif-sur-Yvette, France
fDate :
9/1/2002 12:00:00 AM
Abstract :
We present an explicit analytical solution to the problem of a point current source in a half-space or a plate. Under the hypothesis of a first-order Born approximation, the expression of the vector potential above the plate can then be used to calculate impedance variations due to a flaw in a number of configurations. We demonstrate the method and validate it on a simple case
Keywords :
Green´s function methods; eddy current testing; eddy currents; electric impedance; flaw detection; arbitrary eddy-current probe; eddy-current testing; explicit analytical solution; first-order Born approximation; flaw; half-space; impedance variation; plate; point current source; semianalytical Green function-based method; semianalytical method; vector potential; Approximation methods; Equations; Geometry; Impedance; Implants; Personal communication networks; Probes; Scattering; Solid modeling; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.802712
