Nanohardness and crack resistance of HTS YBCO thin films

Author

Verdyan, A. ; Soifer, Y.M. ; Azoulay, J. ; Rabkin, E. ; Kazakevich, M.

Author_Institution

Sci. Dept., Holon Acad. Inst. of Technol., Israel

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

3585

Lastpage

3588

Abstract

Nanoindentation and nanoscratching using atomic force microscope (AFM) were employed to study the local mechanical properties of high TC superconductors YBCO thin films featuring high critical current density. Two YBCO films sputtered on two different substrates featuring substantial different hardness and Young´s modules (sapphire and SrTiO3) were studied. The microstructure and the mechanical properties such as hardness (H), Young´s modulus (E) and scratch parameters were investigated. The intrinsic hardness and Young´s modulus of YBCO thin films were found to be H ∼ 8.5 GPa, and E ∼ 210 GPa, respectively. The substrate´s influences on the mechanical parameters were found to be insignificant as long as the indentation penetration depth was below approximately 25% of the film thickness.

Keywords

Young´s modulus; atomic force microscopy; barium compounds; critical current density (superconductivity); hardness; high-temperature superconductors; indentation; nanotechnology; sputtering; superconducting thin films; yttrium compounds; HTS YBCO thin films; Young modules; atomic force microscope; crack resistance; nanohardness; nanoindentation; nanoscratching; Atomic force microscopy; Critical current density; High temperature superconductors; Mechanical factors; Sputtering; Substrates; Superconducting films; Superconducting thin films; Transistors; Yttrium barium copper oxide; Cracking; high Tc superconductors; mechanical properties; nanoindentation; thin films;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.849366

Filename

1440447