Title :
Investigation into microwave power dependence of high quality Tl-1223 thin films on LSAT substrate
Author :
Jacob, Mohan V. ; Sundaresan, A. ; Mazierska, J. ; Tanaka, Y.
Author_Institution :
Sch. of Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia
fDate :
6/1/2005 12:00:00 AM
Abstract :
The microwave power dependence of high quality Tl(Ba,Sr)2Ca2Cu3Oy thin films grown on 1´´ diameter LSAT substrates using the Amorphous Phase Epitaxy method has been investigated in this paper. We have performed surface resistance (RS) measurements of Tl-1223 thin films on LSAT using the Hakki-Coleman sapphire dielectric resonator technique in the temperature range 15-94 K. High accuracy in measurements was achieved by using the multi-frequency Transmission Mode Q-Factor Technique. The Tl-1223 films exhibited low surface resistance comparable to YBCO films. When RF power levels were increased the onset of nonlinearity was observed at 0 dBm for all measured temperatures (17, 50, 70 and 84 K).
Keywords :
barium compounds; calcium compounds; high-frequency effects; high-temperature superconductors; strontium compounds; superconducting epitaxial layers; surface conductivity; thallium compounds; 15 to 94 K; Hakki-Coleman sapphire dielectric resonator; LSAT substrate; Tl(BaSr)2Ca2Cu3Oy; YBCO films; amorphous phase epitaxy; high temperature superconductors; microwave power dependence; multifrequency transmission mode Q-factor technique; surface resistance measurements; thallium-1223 thin films; Amorphous materials; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electrical resistance measurement; Epitaxial growth; Microwave theory and techniques; Surface resistance; Temperature measurement; Transistors; High temperature superconductors; Tl-1223; microwave properties; surface resistance;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849368
