Title :
Novel area-time efficient static CMOS totally self-checking comparator
Author_Institution :
Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
fDate :
2/1/1993 12:00:00 AM
Abstract :
The comparator is an essential element in concurrent error detection (CED). To ensure the correctness of error detection processes, comparators must be totally self-checking (TSC): any single fault occurring in the comparator must be detected by at least one normal input pattern, and before the detection of that fault, no erroneous output must be guaranteed. An area-time efficient static CMOS TSC comparator design is presented. This comparator uses only eight transistors and is totally self-checking with respect to stuck-at, stuck-open, stuck-on, bridging faults, and breaks
Keywords :
CMOS integrated circuits; comparators (circuits); error detection; integrated logic circuits; bridging faults; concurrent error detection; static CMOS; stuck-at faults; stuck-on faults; stuck-open faults; totally self-checking comparator; Bridge circuits; Built-in self-test; Circuit faults; Circuit simulation; Delay effects; Digital systems; Error correction; Fault detection; Logic circuits;
Journal_Title :
Solid-State Circuits, IEEE Journal of