• DocumentCode
    843437
  • Title

    Critical current determination of artificially welded HTS samples by in-field Hall mapping technique

  • Author

    Granados, X. ; Bozzo, B. ; Iliescu, S. ; Bartolomé, E. ; Puig, Teresa ; Obradors, X. ; Amorós, Jaume ; Carrera, M.

  • Author_Institution
    ICMAB-CSIC, Bellaterra, Spain
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    3632
  • Lastpage
    3635
  • Abstract
    The direct observation of the magnetic field at the surface of SC samples when the field is applied or in the remanent state, allows the observation of the current distribution along the magnetization loop by using inverse problem solvers. Furthermore, the mean value of the field reflects well the magnetization of the sample obtaining the magnetization loop taken in account both possibilities, the In-Field Hall Mapping technique, thus, has revealed as a powerful characterization technique. This technique can be improved by including the critical state simulation, giving so a very complete way to characterize artificially welded superconducting samples, thus allowing the identification of the critical current flowing through the surface between domains as is the case of the effect of welded bulks. Some examples of the characterization procedures are reported.
  • Keywords
    critical currents; high-temperature superconductors; inverse problems; artificially welded HTS; critical current determination; critical state simulation; in-field hall mapping; inverse problem solvers; magnetic remanence currents; magnetization loop; superconducting welding; superconductor characterization; Critical current; Current distribution; Gaussian processes; High temperature superconductors; Inverse problems; Magnetic field measurement; Magnetization; Superconducting magnets; Welding; Yttrium barium copper oxide; Magnetic remanence currents; superconducting welding; superconductors characterization;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.849377
  • Filename
    1440458