Title :
The Effect of Adhesion on the Static Friction Properties of Sidewall Contact Interfaces of Microelectromechanical Devices
Author :
Timpe, Shannon J. ; Komvopoulos, Kyriakos
Author_Institution :
Dept. of Mech. Eng., California Univ., Berkeley, CA
Abstract :
Static friction between sidewall contact surfaces of polycrystalline silicon micromachines was investigated under different contact pressures, vacuum conditions, relative humidity levels, and temperatures. The static coefficient of friction exhibited a nonlinear dependence on the external contact pressure. A difference between in-contact and pull-out adhesion forces was observed due to the elastic recovery of the deformed asperities at the contact interface. The true static coefficient of friction was determined by considering the effects of the dominant adhesion forces (i.e., van der Waals and capillary forces) on the normal force applied at the sidewall contact interface. The roles of van der Waals and capillary forces in the sidewall friction behavior were analyzed in light of results for the interfacial shear strength and the adhesion force. The major benefits of the present friction micromachine and the developed experimental scheme are discussed in the context of static coefficient of friction and adhesion force results obtained under different environmental and loading conditions
Keywords :
adhesion; humidity; mechanical contact; micromechanical devices; stiction; van der Waals forces; adhesion effect; capillary forces; coefficient of friction; contact pressure; elastic recovery; friction micromachine; interfacial shear strength; microelectromechanical devices; polycrystalline silicon micromachines; relative humidity; sidewall contact interfaces; sidewall surfaces; static friction; van der Waals forces; Actuators; Adhesives; Electrostatics; Friction; Humidity; Microelectromechanical devices; Micromechanical devices; Microstructure; Silicon; Surface topography; Adhesion; capillary forces; coefficient of friction; contact pressure; friction micromachines; relative humidity; sidewall surfaces; static friction; van der Waals forces;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2006.885855