Low temperature scanning laser microscopy of YBCO coated IBAD tapes

Spatially resolved measurements of dissipative state in YBCO coated conductors have been carried out by use of the low temperature scanning laser microscopy (LTSLM). It has been shown that the current dependent dissipation peak is well scaled by the Gaussian distribution, and its normalized distribution becomes narrower in inversely proportion to the square root of power index in the local current-voltage characteristic. From the LTSLM analysis, we can collect positional information of current limiting coordinate as well as spatial variation of local critical current. Optimizing the measurement condition, we also succeeded to visualize the dissipation even in the tape which is covered by a 10 μm thick Ag stabilization layer.