Title :
Secondary Ion Mass Spectrometry at Close to Single-Atom Concentration Using DC Accelerators
Author :
Purser, K.H. ; Litherland, A.E. ; Rucklidge, J.C.
Author_Institution :
General Ionex Corporation, Newburyport, Massachusetts, USA
Keywords :
Acceleration; Atomic measurements; Detectors; Electromagnetic analysis; Geologic measurements; Geology; Interference; Ion accelerators; Mass spectroscopy; Particle accelerators;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1979.4330383
