• DocumentCode
    843607
  • Title

    Study of simplified test procedure for 10-GB-Ethernet fibers

  • Author

    Bunge, C.A. ; Kropp, J.R. ; Petermann, K.

  • Author_Institution
    Inst. of Photonic, Univ. of Berlin, Germany
  • Volume
    14
  • Issue
    11
  • fYear
    2002
  • Firstpage
    1539
  • Lastpage
    1541
  • Abstract
    The bandwidth test under a special restricted mode launch is investigated as a simplified test procedure for the new generation high bandwidth fibers. By computer simulations, possible bandwidth variations are studied for usual deviations from the optimum refractive-index profile under 293 different launching conditions. These launching conditions represent excitations of vertical-cavity surface-emitting lasers (VCSELs) showing normal fabrication tolerances, such as spatial offsets, angular tilts up, and gaps, between the VCSEL and the fiber end face. Although all excitations fulfill the criteria required for transmitters in 10-GB-Ethernet systems, the resulting bandwidth-length products of the same fiber can vary. This dependency is investigated for fibers with different refractive-index profiles.
  • Keywords
    delays; optical fibre LAN; optical fibre testing; optical transmitters; refractive index; refractive index measurement; semiconductor lasers; surface emitting lasers; telecommunication network reliability; 10 GB; GB-Ethernet fibers; VCSEL; angular tilts up; bandwidth test; bandwidth variations; computer simulations; fabrication tolerances; fiber end face; high bandwidth fibers; launching conditions; optimum refractive-index profile; refractive-index profiles; simplified test procedure; spatial offsets; special restricted mode launch; transmitters; vertical-cavity surface-emitting lasers; width-length products; Bandwidth; Computer simulation; Fiber lasers; Laser excitation; Laser modes; Optical device fabrication; Optical fiber testing; Optical refraction; Surface emitting lasers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2002.803386
  • Filename
    1041995