Title :
Scanning optical microscopes close in on submicron scale
Author :
Kino, G.S. ; Corle, T.R.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
fDate :
3/1/1990 12:00:00 AM
Abstract :
The principles and advantages of the confocal scanning optical microscope (CSOM) are described, and the history of the concept is given. The CSOM is compared with the scanning electron microscope, scanning acoustic microscope, scanning tunneling microscope, scanning force microscope, and near-field scanning optical microscope. The imaging properties and applications of the CSOM are discussed.<>
Keywords :
optical microscopes; CSOM; confocal scanning optical microscope; imaging properties; submicron scale; Biological materials; Biomedical optical imaging; Image reconstruction; Lenses; Optical imaging; Optical materials; Optical microscopy; Optical reflection; Visualization; Wavelength measurement;
Journal_Title :
Circuits and Devices Magazine, IEEE
