DocumentCode
843720
Title
Microstructure and field angle dependence of critical current densities in REBa2Cu3Oy thin films prepared by PLD method
Author
Ichino, Y. ; Honda, R. ; Miura, M. ; Itoh, M. ; Yoshida, Y. ; Takai, Y. ; Matsumoto, K. ; Mukaida, M. ; Ichinose, A. ; Horii, S.
Author_Institution
Dept. of Energy Eng. & Sci., Nagoya Univ., Japan
Volume
15
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
3730
Lastpage
3733
Abstract
A c-axis oriented epitaxial REBa2Cu3Oy (RE123) thin film performs excellent superconducting properties in magnetic field. Recently, we reported that a critical current density (Jc) in the RE123 thin film was improved by a deliberate composition control. A Sm1+xBa2-xCu3Oy (Sm123) thin film with a small amount of Sm/Ba substitution x showed the great Jc∼0.17 MA/cm2 in 5 T at 77.3 K, while the Jc in (Yb1-zNdz)Ba2Cu3Oy (Yb/Nd123) thin films depended on an amount of mixed crystal ratio z. In this report, we studied Jc as a function of magnetic field and field orientation with respect to ab-planes. In low magnetic field, the Jc of Sm123 thin film was almost independent of the applied angle of the field. In the case of Yb/Nd123 thin film, extremely high Jc were observed when the magnetic field was aligned parallel or perpendicular to the surface of the film. Because compositional fluctuations in RE123 thin films were observed by transmission electron microscopy, we found that the pinning centers in RE123 thin films are strongly affected by the composition in the thin films.
Keywords
barium compounds; critical current density (superconductivity); crystal microstructure; flux pinning; high-temperature superconductors; neodymium compounds; pulsed laser deposition; samarium compounds; superconducting epitaxial layers; transmission electron microscopy; ytterbium compounds; 5 T; 77.3 K; PLD method; Sm1+xBa2-xCu3Oy; Yb1-zNdzBa2Cu3Oy; critical current density; epitaxial thin film; field angle dependence; magnetic field; microstructure; pinning center; superconducting properties; thin films; transmission electron microscopy; Critical current density; Fluctuations; Magnetic fields; Magnetic films; Magnetic properties; Microstructure; Neodymium; Superconducting epitaxial layers; Superconducting thin films; Transistors; Critical current density; magnetic field; thin film;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2005.849416
Filename
1440482
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