Title :
Transport characteristics in c-axis La2-xSrxCuO4 (LSCO) single crystals
Author :
Kim, Sang-Jae ; Hatano, Takeshi ; Kim, Gui-Sik ; Tachiki, Takashi ; Tanaka, Isao ; Takano, Yoshihiko ; Tachiki, Masashi ; Yamashita, Tsutomu
Author_Institution :
Sch. of Mech. Eng., Cheju Nat. Univ., Jeju-Do, South Korea
fDate :
6/1/2005 12:00:00 AM
Abstract :
c-axis micro-bridges of La2-xSrxCuO4 (LSCO) single crystals were fabricated by the focused-ion-beam (FIB) etching method. Small rectangular LSCO pieces were fabricated by cutting and grinding single crystals of underdoped LSCO of x=0.09. The size of LSCO single crystals between electrodes was cut to (5-20)×40 μm2 in the ab-plane by using the FIB etching method. The junction resistance exhibited clear two-step structures corresponding to the superconducting transition of two different components of crystal structure. Superconductor-insulator-superconductor (SIS) like-branch structures on I-V curves of the LSCO stacks were observed for the first time. The branch structures show voltage jumps of several tens mV in the range of 2 K to 5 K with temperature dependence. When the temperature is changed from 2 K to 5 K, the critical current around zero bias regions splits into a few small voltage jumps with intervals of several mV in the range of 1 mV to 3 mV.
Keywords :
crystal structure; focused ion beam technology; high-temperature superconductors; lanthanum compounds; sputter etching; strontium compounds; superconducting junction devices; LSCO single crystals; La2-xSrxCuO4; c-axis microbridges; crystal structure; focused-ion-beam etching method; high-temperature superconductor; intrinsic Josephson junctions; junction resistance; superconducting transition; superconductor-insulator-superconductor; transport characteristics; two-step structures; Critical current; Crystals; Electrodes; Etching; Josephson junctions; Strontium; Superconducting devices; Temperature dependence; Temperature distribution; Voltage; focused-ion-beam (FIB); high-; intrinsic Josephson junctions (IJJs); multi-branch structures; single crystal;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849430