DocumentCode :
843993
Title :
Operation of HTS Toggle-Flip-Flop Circuit With Improved Layout Design
Author :
Tsubone, Koji ; Wakana, Hironori ; Tarutani, Yoshinobu ; Adachi, Seiji ; Ishimaru, Yoshihiro ; Nakayama, Kohei ; Tanabe, Keiichi
Author_Institution :
Supercond. Res. Lab., Int. Supercond. Technol. Center, Tokyo
Volume :
16
Issue :
4
fYear :
2006
Firstpage :
2011
Lastpage :
2017
Abstract :
Toggle-flip-flop (T-FF) is one of the most important high-Tc superconducting single-flux quantum (HTS SFQ) circuit components and has been designed and fabricated by using YBa2Cu3 O7-delta ramp-edge junction technology. The circuit layout of the T-FF was improved to suppress the junction critical current (Ic) spread in the circuit. Test circuits, which include a T-FF with a single output for evaluating the logic operation and measuring the operating frequency, were fabricated and their operation characteristics were investigated. The T-FF circuit with a single output was successfully operated and finite direct current (dc) supply current margins were obtained at temperatures from 27 to 34 K. Moreover, the maximum operating frequency of the T-FF was estimated to be 360 GHz at 4.2 K and 114 GHz at 41 K. In addition, reduction of dc supply current margins due to thermal noise was also investigated. According to the numerical simulation in which parasitic inductances were taken into account, the narrowest margin in the T-FF circuit wider than plusmn10% was maintained with a bit-error rate (BER) of 10-6 up to 40 K
Keywords :
barium compounds; critical current density (superconductivity); error statistics; flip-flops; high-temperature superconductors; superconducting device noise; superconducting logic circuits; thermal noise; yttrium compounds; 114 GHz; 27 to 34 K; 360 GHz; 4.2 K; 41 K; BER; HTS toggle-flip-flop circuit operation; YBa2Cu3O7-delta; bit-error rate; finite direct current supply current margins; high-Tc superconducting single-flux quantum circuit components; improved layout design; junction critical current; logic operation; narrowest margin; operating frequency; parasitic inductances; ramp-edge junction technology; single output; test circuits; thermal noise; Bit error rate; Circuit testing; Critical current; Current supplies; Frequency estimation; Frequency measurement; High temperature superconductors; Josephson junctions; Logic circuits; Logic testing; High-${rm T}_{rm c}$ superconducting single-flux quantum (HTS SFQ) circuit; YBa $_2$Cu$_3$O$_{7-delta}$ ramp-edge junction; operating margin; thermal noise; toggle-flip-flop (T-FF) circuit;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2006.883457
Filename :
4020347
Link To Document :
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