• DocumentCode
    844089
  • Title

    A monolithic PDMS waveguide system fabricated using soft-lithography techniques

  • Author

    Chang-Yen, David A. ; Eich, Richard K. ; Gale, Bruce K.

  • Author_Institution
    Dept. of Mech. Eng., Univ. of Utah, Salt Lake City, UT, USA
  • Volume
    23
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    2088
  • Lastpage
    2093
  • Abstract
    A monolithic waveguide system using poly(dimethyl siloxane) (PDMS) was designed, fabricated, and characterized. The waveguide demonstrated good confinement of light and relatively low attenuation at 0.40 dB/cm. The robustness and handling properties of the completed waveguides were excellent, and the process yield exceeded 96%. The waveguide did exhibit moderate temperature and humidity sensitivity but no temporal variation, and insertion loss remained stable over extended periods of time. Applications of this waveguide system in microscale sensing are immense, judging by the frequency of use of PDMS as the substrate for microfluidic and biomedical systems. The monolithic nature of the waveguides also reduces their cost and allows integration of optical pathways into existing PDMS-based microsystems.
  • Keywords
    integrated optics; micro-optics; optical design techniques; optical fabrication; optical losses; optical polymers; optical waveguides; soft lithography; PDMS-based microsystems; attenuation; biomedical systems; humidity sensitivity; insertion loss; light confinement; microfluidic systems; microscale sensing; monolithic PDMS waveguide system; optical pathways integration; poly(dimethylsiloxane); soft-lithography techniques; waveguide design; waveguide fabrication; Costs; Frequency; Humidity; Insertion loss; Microfluidics; Optical attenuators; Optical losses; Optical waveguides; Robustness; Temperature sensors; Micro-total-analysis systems; poly(dimethyl siloxane); soft lithography; waveguide;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.849932
  • Filename
    1440516