Application of wavelet modulus maxima in microarray spots recognition

Author

Wang, X.H. ; Istepanian, Robert S H ; Song, Yong Hua

Author_Institution

Mobile Inf. & Network Technol. Centre, Kingston Univ., Kingston Upon Thames, UK

Volume

2

Issue

4

fYear

2003

Firstpage

190

Lastpage

192

Abstract

This paper presents a novel approach to recognize the microarray image spots. The approach is based on the detection of wavelet modulus maxima in the microarray images. The detected maxima is actually the contour of the spots and thus the spots are recognized precisely. Then, the intensities within the contour of the spots can be obtained with low error rate. The test results on example image show this is an effective approach, especially for those spots with low intensities.

Keywords

biological techniques; biology computing; genetics; image processing; wavelet transforms; DNA sequences; gene expression; high-density array; low error rate; low intensities; microarray image spots; microarray images; microarray spots recognition; solid surface; wavelet analysis; wavelet modulus maxima; Computer networks; Error analysis; Histograms; Image processing; Image recognition; Information systems; Mobile computing; Shape; Testing; Wavelet transforms; Algorithms; DNA; Gene Expression Profiling; Image Enhancement; Image Interpretation, Computer-Assisted; Microscopy, Fluorescence; Nanotechnology; Oligonucleotide Array Sequence Analysis; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Sequence Analysis, DNA; Signal Processing, Computer-Assisted;

fLanguage

English

Journal_Title

NanoBioscience, IEEE Transactions on

Publisher

ieee

ISSN

1536-1241

Type

jour

DOI

10.1109/TNB.2003.816230

Filename

1254521