Title :
Effect of exchange coupling strength on magnetic and recording properties of SAF media
Author :
Malhotra, S.S. ; Shan, Z.S. ; Stafford, D.C. ; Bertero, G. ; Wachenschwanz, D.
Author_Institution :
KOMAG Inc., San Jose, CA, USA
fDate :
9/1/2002 12:00:00 AM
Abstract :
In this work, the effect of exchange coupling strength on magnetic and recording properties of synthetic anti-ferromagnetic (SAF) media is investigated. The coupling strength depends on the magnetization and thickness of the bottom layer. The magnetic reversal properties Mrt, Hcr and KuV/kBT were measured for both the top and bottom layers as a function of the bottom layer thickness. It was observed that with the increase in coupling constant J the thermal stability increases for both the top and bottom layers. The effect of increasing Hex on the thermal stability and media noise is also reported.
Keywords :
antiferromagnetic materials; chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); magnetic hysteresis; magnetic multilayers; magnetic recording; magnetic recording noise; magnetisation reversal; sputtered coatings; thermal stability; CrMo/CoCr/CoCrXY/Ru/CoCrPtB structure; NiP-Al; bottom layer thickness; coercivity; dc magnetron sputtering; exchange coupling strength; magnetic hysteresis loop; magnetic properties; magnetic reversal properties; magnetization; media noise; recording properties; synthetic antiferromagnetic media; textured NiP/Al substrates; thermal stability; top layers; Antiferromagnetic materials; Couplings; Force measurement; Magnetic anisotropy; Magnetic field measurement; Magnetic properties; Magnetic recording; Perpendicular magnetic anisotropy; Saturation magnetization; Thermal stability;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.802855
