Title :
CMOS microsystem for AC current measurement with galvanic isolation
Author :
Frick, VIncent ; Hébrard, Luc ; Poure, Philippe ; Anstotz, Freddy ; Braun, Francis
Author_Institution :
Lab. d´´Electronique et de Phys. des Syst.s Instrum.aux, Univ. Louis Pasteur, Strasbourg, France
Abstract :
In this paper, we present an integrated ac current sensor based on sensitivity-optimized horizontal Hall effect devices and a differential readout chain. This microsystem has been designed for 5-A rms nominal ac current measurement with 5-kV galvanic isolation and 0.5% accuracy after calibration from 250 mA to 5 A, over 1.5-kHz bandwidth, which allows up to 30th (25th) harmonic detection in 50-Hz (60-Hz) applications. This qualifies the current sensor microsystem for class 1 products according to international norms for energy meters (IEC44-1 and IEC1036). From the sensing element throughout the instrumental chain´s output, the signal conditioning is exclusively performed by low-noise standard CMOS analog blocks. Moreover, the whole microsystem features a mixed-signal structure dedicated to auto-balancing.
Keywords :
CMOS integrated circuits; Hall effect transducers; electric current measurement; microsensors; mixed analogue-digital integrated circuits; 1.5 kHz; 5 A; 5 kV; 50 Hz; 60 Hz; CMOS microsystem; IEC1036; IEC44-1; auto-balancing; calibration; differential readout chain; galvanic isolation; harmonic detection; integrated AC current sensor; low-noise standard CMOS analog blocks; mixed-signal structure; nominal AC current measurement; sensitivity-optimized horizontal Hall effect devices; signal conditioning; submicron CMOS technology; CMOS technology; Current measurement; Electromagnetic compatibility; Galvanizing; Hall effect devices; Instruments; Isolation technology; Magnetic field measurement; Magnetic sensors; Noise reduction;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2003.820555
