Title :
High-coercivity CoCrPt-Ti perpendicular media by in situ interdiffusion of CrMn ultrathin overlayers
Author :
Roy, A.G. ; Jeong, S. ; Laughlin, D.E.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
9/1/2002 12:00:00 AM
Abstract :
We have investigated the magnetic and structural properties of CoCrPt perpendicular films with respect to in situ interdiffusion of CrMn from top layers. We have observed a coercivity of 5700 Oe in films with a thin CrMn overlayer, which is greater than two times larger than similar type of films without a CrMn overlayer. This increment is attributed to the decoupling of grains by diffusion of CrMn from top layer through the grain boundaries.
Keywords :
chemical interdiffusion; chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic materials; grain boundaries; magnetic thin films; manganese alloys; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; titanium; CoCrPt-Ti; CoCrPt-Ti-CrMn; CrMn ultrathin overlayers; coercivity; grain boundaries; grain decoupling; high-coercivity CoCrPt-Ti perpendicular media; in situ interdiffusion; magnetic properties; structural properties; top layers; Annealing; Coercive force; Force measurement; Grain boundaries; Magnetic films; Magnetic hysteresis; Magnetic properties; Perpendicular magnetic recording; Semiconductor thin films; Sputtering;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.801815
