Title :
The Surface Sensitivity of MeV Ion Scattering
Author :
Ignatiev, A. ; Bøgh, E.
Author_Institution :
Institute of Physics, Aarhus University, 8000 Aarhus C, Denmark and Department of Physics, University of Houston, Houston, Texas 77004
Abstract :
400 keV helium ions have been scattered in the single channeling mode from a Ni(001) surface covered with an adsorbed ordered overlayer of tellurium. The atomic surface structure of the Ni(001)-C(2 x 2)-Te system was checked by low-energy electron-diffraction (LEED) and confirmed to be that reported earlier. The channeling results however, have not at this point in time yielded atomic surface structure information which can unambiguously confirm or deny the LEED results.
Keywords :
Atomic layer deposition; Atomic measurements; Energy resolution; Helium; Nickel; Physics; Scattering; Surface cleaning; Surface structures; Tellurium;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1979.4330494