DocumentCode :
844669
Title :
The Surface Sensitivity of MeV Ion Scattering
Author :
Ignatiev, A. ; Bøgh, E.
Author_Institution :
Institute of Physics, Aarhus University, 8000 Aarhus C, Denmark and Department of Physics, University of Houston, Houston, Texas 77004
Volume :
26
Issue :
1
fYear :
1979
Firstpage :
1824
Lastpage :
1826
Abstract :
400 keV helium ions have been scattered in the single channeling mode from a Ni(001) surface covered with an adsorbed ordered overlayer of tellurium. The atomic surface structure of the Ni(001)-C(2 x 2)-Te system was checked by low-energy electron-diffraction (LEED) and confirmed to be that reported earlier. The channeling results however, have not at this point in time yielded atomic surface structure information which can unambiguously confirm or deny the LEED results.
Keywords :
Atomic layer deposition; Atomic measurements; Energy resolution; Helium; Nickel; Physics; Scattering; Surface cleaning; Surface structures; Tellurium;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1979.4330494
Filename :
4330494
Link To Document :
بازگشت