• DocumentCode
    844777
  • Title

    Applying material optimization to fracture mechanics analysis to improve the reliability of the plastic IC package in reflow soldering process

  • Author

    Geun Woo Kim ; Kang Yong Lee

  • Author_Institution
    Sch. of Mech. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    29
  • Issue
    1
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    47
  • Lastpage
    53
  • Abstract
    To prevent crack propagation in a plastic small outline J-lead package with a dimpled diepad under an IR soldering process, parametric study and optimization with respect to material properties are done. The main design variables among all material properties are determined from the parametric study. Their optimized values are determined by applying a constraint optimization technique to the IC package.
  • Keywords
    fracture mechanics; integrated circuit packaging; integrated circuit reliability; optimisation; plastic packaging; reflow soldering; IR soldering process; constraint optimization technique; crack propagation; fracture mechanics analysis; integrated circuit reliability; material optimization; plastic IC package reliability; plastic J-lead package; reflow soldering process; thermal loading; Electromagnetic compatibility; Integrated circuit packaging; Material properties; Materials reliability; Moisture; Parametric study; Plastic integrated circuit packaging; Reflow soldering; Temperature; Thermal stresses; Constraint optimization; parametric study; plastic IC package; thermal loading;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2005.850512
  • Filename
    1599492