• DocumentCode
    844941
  • Title

    60-GHz high power performance In/sub 0.35/Al/sub 0.65/As-In/sub 0-35/Ga/sub 0.65/As metamorphic HEMTs on GaAs

  • Author

    Zaknoune, Mohammed ; Ardouin, M. ; Cordier, Y. ; Bollaert, S. ; Bonte, B. ; Theron, Didier

  • Author_Institution
    Inst. d´Electronique, de Microelectronique et de Nanotechnologie, Villeneuve d´Ascq, France
  • Volume
    24
  • Issue
    12
  • fYear
    2003
  • Firstpage
    724
  • Lastpage
    726
  • Abstract
    We report on a double-pulse doped, double recess In/sub 0.35/Al/sub 0.65/As-In/sub 0.35/Ga/sub 0.65/As metamorphic high electron mobility transistor (MHEMT) on GaAs substrate. This 0.15-μm gate MHEMT exhibits excellent de characteristics, high current density of 750 mA/mm, extrinsic transconductance of 700 mS/mm. The on and off state breakdown are respectively of 5 and 13 V and defined It gate current density of 1 mA/mm. Power measurements at 60 GHz were performed on these devices. Biased between 2 and 5 V, they demonstrated a maximum output power of 390 mW/mm at 3.1 V of drain voltage with 2.8 dB power gain and a power added efficiency (PAE) of 18%. The output power at 1 dB gain compression is still of 300 mW/mm. Moreover, the linear power gain is of 5.2 dB. This is to our knowledge the best output power density of any MHEMT reported at this frequency.
  • Keywords
    III-V semiconductors; aluminium compounds; current density; gallium arsenide; high electron mobility transistors; indium compounds; millimetre wave field effect transistors; semiconductor device breakdown; 5.2 dB; 60 GHz; DC characteristics; GaAs; In/sub 0.35/Al/sub 0.65/As-In/sub 0.35/Ga/sub 0.65/As; double recess; double-pulse doped; extrinsic transconductance; high current density; high power performance; linear power gain; metamorphic high electron mobility transistor; molecular beam epitaxy; off state breakdown; on state breakdown; output power density; Current density; Electric breakdown; Gain; Gallium arsenide; HEMTs; MODFETs; Power generation; Power measurement; Transconductance; mHEMTs;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2003.819914
  • Filename
    1254598