DocumentCode :
844976
Title :
Solid-state refrigeration for cooling microprocessors
Author :
Ramanathan, S. ; Chrysler, G.M.
Author_Institution :
Components Res. Dept., Intel Corp., Hillsboro, USA
Volume :
29
Issue :
1
fYear :
2006
fDate :
3/1/2006 12:00:00 AM
Firstpage :
179
Lastpage :
183
Abstract :
Thin-film thermoelectrics (TECs) are potential candidates for cooling microprocessors due to their large cooling power density and ability to integrate with packages. In addition, there are no moving parts or noise generated during their operation. In particular, thin-film TECs offer the ability to cool localized regions of high heat flux (hot spots) in the die selectively, which is very useful for chips with nonuniform power maps. In this paper, we theoretically analyze the performance of thin-film TECs for reducing the junction temperature at hot spots in a die. We report the reduction in junction temperature for a representative power map as a function of input power to the TEC films for the first time. The potential benefits and limitations of scaling the TEC legs are calculated by solving the general TEC equations within a fully three-dimensional numerical model of the assembled die and package. Parasitic electrical contact resistance and back conduction from the hot-side to cold-side through any encapsulating or material surrounding TEC legs are also included in the model. Model calculations are performed for TEC figure of merit (ZT) values of 1 and 3 (for comparison). We determine an operating envelope for the TECs that leads to an optimum cooling capability. The impact of operating the TECs are calculated as well taking into account the temperature increase of the heat spreader due to heat influx from the hot-side of the TEC. It is shown that material breakthroughs as well as process improvements could enable solid-state refrigeration to be an attractive candidate for spot cooling in microprocessors.
Keywords :
assembling; contact resistance; cooling; encapsulation; microprocessor chips; refrigeration; thermal management (packaging); thermoelectricity; thin films; heat flux; heat influx; heat spreader; junction temperature; large cooling power density; microprocessor cooling; model calculations; parasitic electrical contact resistance; reduction injunction temperature; solid-state refrigeration; thin-film thermoelectrics; Cooling; Leg; Microprocessors; Noise generators; Packaging; Refrigeration; Solid state circuits; Temperature; Thermoelectricity; Transistors; Figure of merit (ZT) values; thin-film thermoelectrics (TECs);
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2006.870392
Filename :
1599508
Link To Document :
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