DocumentCode :
845284
Title :
1/f noise synthesis model in discrete-time for circuit simulation
Author :
Narasimha, Rajesh ; Bandi, Sri Priya ; Rao, Raghuveer M. ; Mukund, P.R.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
52
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
1104
Lastpage :
1114
Abstract :
Flicker noise, popularly known as 1/f noise is a commonly observed phenomenon in semiconductor devices. To incorporate 1/f noise in circuit simulations, models are required to synthesize such noise in discrete time. This paper proposes a model based on the fact that 1/f processes belong to the class of statistically self-similar random processes. The model generates 1/f noise in the time domain (TD) with a simple white noise input and is parameterized by a quantity whose value can be adjusted to reflect the desired 1/f parameter, that is, the slope of the 1/f spectrum. It thus differs from most of the earlier modeling approaches, which were confined to the spectral domain. To verify fit between the model and actual 1/f noise measurements, experiments were conducted using discrete devices such as a PIN photodiode at various bias conditions and sampling frequencies. The noise synthesized by the model was found to provide a good match to the measurements. Furthermore, it is demonstrated that the proposed 1/f noise model can also be incorporated in circuit simulations as a noise current or noise voltage source, which was not feasible earlier with the conventional spectral domain representation. To validate the inclusion of 1/f noise in circuits as TD current or voltage, simulations were carried out on a CMOS ring oscillator and the clock jitter due to 1/f noise was investigated.
Keywords :
1/f noise; circuit simulation; discrete time systems; flicker noise; oscillators; photodiodes; semiconductor device models; white noise; 1/f noise synthesis model; PIN photodiode; circuit simulation; discrete time; flicker noise; fractional order models; random processes; semiconductor devices; statistical self-similarity; white noise; 1f noise; Circuit noise; Circuit simulation; Circuit synthesis; Noise generators; Noise measurement; Random processes; Semiconductor device noise; Semiconductor devices; White noise; circuit simulation; discrete time; fractional order models; photodiode; ring oscillator; statistical self-similarity;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2005.849112
Filename :
1440633
Link To Document :
بازگشت