DocumentCode :
845317
Title :
New realization of the ohm and farad using the NBS calculable capacitor
Author :
Shields, John Q. ; Dziuba, Ronald F. ; Layer, Howard P.
Author_Institution :
NBS, Gaithersburg, MD, USA
Volume :
38
Issue :
2
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
249
Lastpage :
251
Abstract :
Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, ΩNBS at the rate of -0.054 p.p.m./year and FNBS at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1σ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1σ)
Keywords :
capacitance measurement; capacitors; electric resistance measurement; quantum Hall effect; units (measurement); NBS calculable capacitor; SI value; US National Bureau of Standards; capacitance measurement; electric resistance measurement; farad; ohm; quantized Hall resistance; Bridge circuits; Capacitance; Capacitors; Electric resistance; Electrical resistance measurement; Frequency measurement; Laboratories; NIST; Resistors; Uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.192281
Filename :
192281
Link To Document :
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