Title :
SI value of quantized Hall resistance based on ETL´s calculable capacitor
Author :
Shida, Katsunori ; Wada, Toshimi ; Nishinaka, Hidefumi ; Segawa, Koji ; Igarashi, Takashi
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
fDate :
4/1/1989 12:00:00 AM
Abstract :
The SI value of the quantized Hall resistance based on Electrotechnical Laboratory´s (ETL) calculable capacitor is presented. Some improvements for previous measurement systems were made and some of the measurement techniques were changed. Based on measurements of ETL, the value of h/e2 is estimated to be 25,812.8064 ΩSI with a systematic uncertainty of 0.24-p.p.m. root-sum-square (r.s.s.) and a random error of 0.11-p.p.m. at one standard deviation (1σ)
Keywords :
electric resistance measurement; measurement errors; measurement standards; quantum Hall effect; units (measurement); ETL´s calculable capacitor; SI value; electric resistance measurement; h/e2; quantized Hall resistance; random error; systematic uncertainty; Bridge circuits; Capacitance; Capacitors; Electrical resistance measurement; Electrodes; Laboratories; Measurement standards; Measurement techniques; Q measurement; Resistors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
