• DocumentCode
    845326
  • Title

    SI value of quantized Hall resistance based on ETL´s calculable capacitor

  • Author

    Shida, Katsunori ; Wada, Toshimi ; Nishinaka, Hidefumi ; Segawa, Koji ; Igarashi, Takashi

  • Author_Institution
    Electrotech. Lab., Ibaraki, Japan
  • Volume
    38
  • Issue
    2
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    252
  • Lastpage
    255
  • Abstract
    The SI value of the quantized Hall resistance based on Electrotechnical Laboratory´s (ETL) calculable capacitor is presented. Some improvements for previous measurement systems were made and some of the measurement techniques were changed. Based on measurements of ETL, the value of h/e2 is estimated to be 25,812.8064 ΩSI with a systematic uncertainty of 0.24-p.p.m. root-sum-square (r.s.s.) and a random error of 0.11-p.p.m. at one standard deviation (1σ)
  • Keywords
    electric resistance measurement; measurement errors; measurement standards; quantum Hall effect; units (measurement); ETL´s calculable capacitor; SI value; electric resistance measurement; h/e2; quantized Hall resistance; random error; systematic uncertainty; Bridge circuits; Capacitance; Capacitors; Electrical resistance measurement; Electrodes; Laboratories; Measurement standards; Measurement techniques; Q measurement; Resistors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.192282
  • Filename
    192282
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=845326