Title :
90-nm process-variation adaptive embedded SRAM modules with power-line-floating write technique
Author :
Yamaoka, Masanao ; Maeda, Noriaki ; Shinozaki, Yoshihiro ; Shimazaki, Yasuhisa ; Nii, Koji ; Shimada, Shigeru ; Yanagisawa, Kazumasa ; Kawahara, Takayuki
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fDate :
3/1/2006 12:00:00 AM
Abstract :
The power consumption of a low-power system-on-a-chip (SoC) has a large impact on the battery life of mobile appliances. General SoCs have large on-chip SRAMs, which consume a large proportion of the whole LSI power. To achieve a low-power SoC, we have developed embedded SRAM modules, which use some low-power SRAM techniques. One technique involves expanding the write margin; another is a power-line-floating write technique, which enables low-voltage write operation. The power-line-floating write technique makes it possible to lower the minimum operating supply voltage by 100 mV. The other techniques involve using a process-variation-adaptive write replica circuit and reducing leakage current. These techniques reduce active power during write operations by 18% and reduce active leakage of the word-line driver by 64%. The prototype SRAM modules achieve 0.8-V operation, and a 512-kb SRAM module achieves 48.4-μA active leakage and 7.8-μA standby leakage with worst-leakage devices.
Keywords :
leakage currents; low-power electronics; random-access storage; system-on-chip; 0.8 V; 100 mV; 48.4 muA; 512 kbit; 7.8 muA; 90 nm; leakage current; low-voltage write operation; power-line-floating write technique; process-variation adaptive embedded SRAM modules; process-variation-adaptive write replica circuit; system-on-a-chip; write margin; Batteries; Driver circuits; Energy consumption; Home appliances; Large scale integration; Leakage current; Prototypes; Random access memory; System-on-a-chip; Voltage; Low leakage; SRAM; low-voltage operation; write margin;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2006.869786