• DocumentCode
    845360
  • Title

    A 0.5-V 25-MHz 1-mW 256-kb MTCMOS/SOI SRAM for solar-power-operated portable personal digital equipment - sure write operation by using step-down negatively overdriven bitline scheme

  • Author

    Shibata, Nobutaro ; Kiya, Hiroshi ; Kurita, Shigehiro ; Okamoto, Hidetaka ; Tan´no, M. ; Douseki, Takakuni

  • Author_Institution
    NTT Electron. Corp., Machida, Japan
  • Volume
    41
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    728
  • Lastpage
    742
  • Abstract
    Multithreshold-voltage CMOS (MTCMOS) technology has a great advantage in that it provides high-speed operation with low supply voltages of less than 1 V. A logic gate with low-Vth MOSFETs has a high operating speed, while a low-leakage power switch with a high-Vth MOSFET eliminates the off-leakage current during sleep time. By using MTCMOS circuits and silicon-on-insulator (SOI) devices, the authors have developed a 256-kb SRAM for solar-power-operated digital equipment. A double-threshold-voltage MOSFET (DTMOS) is adopted for the power switch to further reduce the off leakage. As regards the SRAM core design, we consider a hybrid configuration consisting of high-Vth and low-Vth MOSFETs (that is, multi-Vth CMOS). A new memory cell with a separate read-data path provides a larger readout current without degrading the static noise margin. A negatively overdriven bitline scheme guarantees sure write operation at ultralow supply voltages close to 0.5 V. In addition, a charge-transfer amplifier integrated with a selector and data latches for intrabus circuitry are installed to enhance the operating speed and/or reduce power dissipation. A 32K-word × 8-bit SRAM chip, fabricated with the 0.35-μm multi-Vth CMOS/SOI process, has successfully operated at 25 MHz under typical conditions with 0.5-V (SRAM core) and 1-V (I/O buffers) power supplies. The power dissipation during sleep time is less than 0.4 μW and that for 25-MHz operation is 1 mW, excluding that of the I/O buffers.
  • Keywords
    CMOS memory circuits; SRAM chips; leakage currents; low-power electronics; silicon-on-insulator; solar cells; 0.5 V; 1 mW; 25 MHz; 256 kbit; MTCMOS circuits; SRAM core design; charge-transfer amplifier; data latches; double-threshold-voltage MOSFET; intrabus circuitry; leakage current; logic gate; low-Vth MOSFET; multithreshold-voltage CMOS technology; negatively overdriven bitline scheme; read-data path; readout current; silicon-on-insulator devices; solar power cell; solar-power-operated digital equipment; squashed memory cell; static noise margin; write operation; CMOS logic circuits; CMOS technology; Logic devices; Logic gates; Low voltage; MOSFETs; Power dissipation; Random access memory; Silicon on insulator technology; Sleep; 0.5-V operation; High speed; MTCMOS; SOI; SRAM; low power; negatively overdriven bitline; solar power cell; squashed memory cell; ultralow-voltage write operation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2005.864124
  • Filename
    1599541