DocumentCode
845485
Title
The applicability of CPP-GMR heads for magnetic recording
Author
Takagishi, M. ; Koi, K. ; Yoshikawa, M. ; Funayama, T. ; Iwasaki, H. ; Sahashi, M.
Author_Institution
Corporate R&D Center, Toshiba Corp., Kawasaki, Japan
Volume
38
Issue
5
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
2277
Lastpage
2282
Abstract
In this paper, we mainly discuss the extendability of current perpendicular to plane giant magnetoresistive (CPP-GMR) heads beyond 100 Gbpsi by using micromagnetic simulation and simulation techniques. An area map of CPP-GMR´s resistance-area product (RA) and magnetoresistive ratio for several areal densities is made, which suggests that downsizing of a CPP-GMR head does not cause a decrease in output voltage differently from a current in plane GMR (CIP-GMR) head. At this point, a CPP-GMR has the advantage of extendability to a higher areal density over CIP-GMR, and is the major candidate for the next generation. A CIP-GMR seems to have a scalability limit around 100-200 Gbpsi. On the other hand, the area map also suggests that the RA of the CPP-GMR is a more important keyfactor for higher areal density than for CIP-GMR. The CPP-GMR, therefore, requires not only higher MR, but also less RA as areal density gets higher. Tunneling MR (TMR) has exactly the same problem, so CPP-GMR also has many advantages over TMR, with too high an RA. Additionally, we present CPP-GMR films with the potential for around 500 Gbpsi and discuss a suitable read-head structure for CPP-GMR. Micromagnetic simulation results indicate that the read track width will be controlled by a magnetic field due to the sense current of CPP. We will discuss overall studies on scalability of CPP-GMR.
Keywords
giant magnetoresistance; magnetic heads; magnetoresistive devices; CPP-GMR head; area map; areal density; magnetic field; magnetic recording; magnetoresistive ratio; micromagnetic simulation; read head; resistance-area product; scalability; Finite difference methods; Giant magnetoresistance; Magnetic fields; Magnetic films; Magnetic heads; Magnetic recording; Micromagnetics; Scalability; Tunneling magnetoresistance; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2002.802804
Filename
1042161
Link To Document