Title :
Fast Measurements of Entangled Photons
Author :
Wang, Shan X. ; Moraw, P. ; Reilly, D.R. ; Altepeter, Joseph B. ; Kanter, G.S.
Author_Institution :
NuCrypt, LLC, Evanston, IL, USA
Abstract :
We report on a system for the generation and measurement of polarization entangled photons. High speed quantum state tomographies with a raw fidelity of >; 91 % with respect to an ideal entangled state are recorded in <; 2 seconds, with longer-term accidental-count subtracted fidelities exceeding 99%. Two-photon interference measurements are recorded using an automated alignment and measurement procedure with the signal distributed over 20 km of fiber. These high speed measurement methods are useful for high rate monitoring of entangled states.
Keywords :
light interference; light polarisation; multiphoton processes; quantum entanglement; automated alignment; distance 20 km; high speed measurement methods; high speed quantum state tomographies; ideal entangled state; polarization entangled photons; two-photon interference measurements; Logic gates; Loss measurement; Optical fiber devices; Optical fiber polarization; Photonics; Quantum entanglement; Tomography; Quantum entanglement; optical polarization; optical signal detection;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2012.2231854
